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Title Light-emitting diodes and optoelectronics : new research / editors, Joshua T. Hall and Anton O. Koskinen.
Imprint New York : Nova Science Publishers, ©2012.

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Description 1 online resource
Series Electrical engineering developments
Electrical engineering developments series.
Bibliog. Includes bibliographical references and index.
Note Available only to authorized UTEP users.
Print version record.
Subject Light emitting diodes.
Optoelectronic devices.
Contents LIGHT-EMITTING DIODES AND OPTOELECTRONICS ; LIGHT-EMITTING DIODES AND OPTOELECTRONICS ; CONTENTS ; PREFACE ; APPROACHES FOR FABRICATING HIGH EFFICIENCY ORGANIC LIGHT EMITTING DIODE FOR FLAT PANEL DISPLAY AND SOLID STATE LIGHTING: AN OVERVIEW ; ABSTRACT ; 1. INTRODUCTION; 2. APPROACHES FOR HIGHLY EFFICIENT DEVICES ; 2.1. Device Structure ; 2.1.1. Low Carrier Injection Barrier ; 2.1.2. Effective Carrier Confinement ; 2.1.3. Effective Excitons Generation on Host ; 2.1.4. Effective Host-Guest Energy Transfer ; 2.1.5. Balanced Carrier Injection; 2.1.6. Carrier Modulation Layer.
2.1.7. Polymeric Nanodots (PNDs)2.2. Light Outcoupling ; 2.2.1. Substrate Surface Modifications ; 2.2.2. Texturing Mesh Surfaces ; 2.2.3. Multilayer Cathode Structures ; 2.2.4. Aperiodic Dielectric Stacks ; 2.2.5. Microlens Arrays; 2.2.6. Low Index Grids ; 2.2.7. Effect of Micro-cavities; 2.2.8. Surface Plasmons ; 2.2.9. Photonic Crystal ; 2.2.10. Effect of Nano Porous Films, Nano Wires, Nano Particles and Nano Pillars ; CONCLUSION ; ACKNOWLEDGMENTS; REFERENCES ; RELIABILITY ESTIMATION FROM THE JUNCTION TO THE PACKAGING OF LED; I. CONTEXT AND OBJECTIVES.
II. STATE OF ART OF THE LED MODULE III. MODEL OF THE LED MODULE ; 1. Thermal Simulation ; 2. Optical Models ; a. Optical Power Characterizations; b. Spectral Characterizations ; 3. Electrical Model ; IV. FAILURE ANALYSES ; 1. Ageing Test Conditions -- Active Storage ; 2. Analysis of Recombination Current Drift ; a)Failure Mechanism Diagnostic Using Electrical Characterizations ; b. Failure Mechanism Diagnostic Using Optical Characterizations ; 3. Analyses of Leakage Current ; V. RELIABILITY ESTIMATION ; 1. Relation between Degradation Law and Lifetime Estimation.
2. Reliability Investigations Using Technological Dispersion CONCLUSION; REFERENCES ; THE NEXT-GENERATION INTELLIGENT AND GREEN ENERGY LED BACKLIGHTING 3D DISPLAY TECHNOLOGY FOR THE NAKED EYE ; ABSTRACT ; 1. INTRODUCTION ; Intelligent and Green Energy LED Backlighting Techniques ; 2. 3D DISPLAY BACKLIGHT AND APPLICATION ; 2.1. Localized 2D/3D Switchable Maked-eye 3D Display; 2.2. Mult-view Time Multiplexed Autostereoscopic Displays ; 2.3. Multi-Viewer Tracking Stereoscopic Display ; 3. EXPERIMENTAL AND RESULTS ; 3.1. Localized 2D/3D Switchable Maked-eye 3D Display.
3.1.1. Three Dimensional Data Registration LED Backlight 3.1.2. Localized 2D/3D Switchable Naked-eye 3D Display ; 3.3. Mult-View Time Multiplexed Autostereoscopic Displays ; 3.3.1. Experimental Results ; 3.4. Multi-viewer Tracking Stereoscopic Display ; (B) LED Backlight Architecture ; 3.4.1. Crosstalk Analysis ; 3.4.2. Measured Results; (A) The Optical Properties Measurement ; (B) Motion Parallax Function Result ; CONCLUSION; REFERENCES ; INTERSUBBAND TRANSITION IN CDS/ZNSE QUANTUM WELLS FOR EMISSION AND INFRARED PHOTO DETECTION ; ABSTRACT ; INTRODUCTION; THEORY.
Other Author Hall, Joshua T.
Koskinen, Anton O.
Other Title Print version: Light-emitting diodes and optoelectronics. New York : Nova Science Publishers, ©2012 9781621004486 1621004481