Limit search to items available for checkout
Title Design and analysis of integrator-based log-domain filter circuits / Gordon W. Roberts and Vincent W. Leung.
Imprint New York : Kluwer Academic, ©2002.


 Internet  Electronic Book    AVAILABLE
Description 1 online resource (xxiii, 254 pages) : illustrations
Series The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, 0893-3405 ; 534
International series in engineering and computer science. Analog circuits and signal processing ; 534. 0893-3405
Bibliog. Includes bibliographical references and index.
Note Available only to authorized UTEP users.
Print version record.
Subject Log domain filters -- Design and construction.
Electric circuit analysis.
Metal oxide semiconductors, Complementary -- Design and construction.
Bipolar integrated circuits -- Design and construction.
Summary Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a ̀must read' before any DFT is attempted.
Other Author Leung, Vincent W., author.
Other Title Print version: Roberts, Gordon W., 1959- Design and analysis of integrator-based log-domain filter circuits. New York : Kluwer Academic, ©2002 079238699X