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E-BOOK
Title Monte Carlo modeling for electron microscopy and microanalysis / David C. Joy.
Imprint New York : Oxford University Press, 1995.

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 Internet  Electronic Book    AVAILABLE
Description 1 online resource (viii, 216 pages) : illustrations
Series Oxford series in optical and imaging sciences ; 9
Oxford series in optical and imaging sciences ; 9.
Bibliog. Includes bibliographical references and index.
Note Available only to authorized UTEP users.
Print version record.
Subject Electron microscopy -- Computer simulation.
Electron probe microanalysis -- Computer simulation.
Monte Carlo method.
Genre Electronic books.
Contents 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index.
Summary 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
Other Title Print version: Joy, David C., 1943- Monte Carlo modeling for electron microscopy and microanalysis. New York : Oxford University Press, 1995 0195088743 9780195088748