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Subjects (1-4 of 4)
Silicon -- Defects.
c1981
BOOK
Imperfections and impurities in semiconductor silicon
Ravi, K. V., 1940-
New York : Wiley, c1981.

Copies / Volumes

2
1978-
MICROFORM
Quantitative analysis of defects in silicon : silicon sheet growth development for the large area si
[Washington, D.C.] : Dept. of Energy ; [Springfield, Va.] : [For sale by the National Technical Information Servce], 1978-

Copies / Volumes

LOCATION CALL # STATUS
 GovDocs Federal/Fiche  E 1.28:DOE/JPL/954977-1    AVAILABLE
3
1978
MICROFORM
Quantitative analysis of defects in silicon : silicon sheet growth development for the large area si
[Washington, D.C.] : Dept. of Energy ; [Springfield, Va.] : [For sale by the National Technical Information Servce], 1978.

Copies / Volumes

LOCATION CALL # STATUS
 GovDocs Federal/Fiche  E 1.28:DOE/JPL/954977-2    AVAILABLE
 GovDocs Federal/Fiche  E 1.28:DOE/JPL/954977-6    AVAILABLE
4
1979
BOOK
The theoretical and experimental study of the temperature and dopant density dependence of hole mobi
Li, Sheng S., 1938-
[Washington] : Dept. of Commerce, National Bureau of Standards : U.S. Govt. Print. Off., 1979.

Copies / Volumes

LOCATION CALL # STATUS
 GovDocs Federal  C 13.10:400-  no.43-51    AVAILABLE
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