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MICROFORM
Title X-ray measurements of stresses and defects in EFG and large grained polycrystalline silicon ribbons : first quarterly report.
Imprint [Washington, D.C.] : Dept. of Energy ; Springfield, Va. : For sale by the National Technical Information Service, 1978.

Copies/Volumes

LOCATION CALL # STATUS
 GovDocs Federal/Fiche  E 1.28:DOE/JPL/954851-1    AVAILABLE
Description iii, 10 pages : illustrations ; 28 cm.
Series DOE/JPL ; 954851-1.
Note Author: C.N.J. Wagner.
Contract no. NAS-7-100-954851.
Reproduction Microfiche. Washington, D.C. : U.S. G.P.O., 1978. 1 microfiche : negative.
Subject Silicon -- Defects -- Measurement.
Residual stresses.
Residual stresses.
Other Author Wagner, C. N. J.
United States. Department of Energy.