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MICROFORM
Title Measurement techniques for high-resistivity detector-grade silicon : progress report, July 1, 1982 to June 30, 1983 / R.D. Larrabee and J.R. Lowney ; prepared for Electronics Technology and Devices Laboratory.
Imprint Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards ; [Springfield, Va.] : [Order from National Technical Information Service], [1983]

Copies/Volumes

LOCATION CALL # STATUS
 GovDocs Federal/Fiche  C 13.58:83-2792    AVAILABLE
Description iv, 16 pages : illustrations ; 28 cm.
Series NBSIR ; 83-2792.
NBSIR ; 83-2792.
Note "December 1983."
Bibliog. Includes bibliographical references (pages 15-16) . 11.
Note 7/1/82-6/30/83.
82-JAK-06.
Reproduction Microfiche. [Washington? D.C.] : SUPTDOCS/GPO, [1984]. 1 microfiche : negative.
Subject Silicon -- Measurement.
Other Author Lowney, J. R. (Jeremiah Ralph), 1946-
Electronics Technology and Devices Laboratory (U.S.)
United States. National Bureau of Standards.