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Title Ion spectroscopies for surface analysis / edited by A.W. Czanderna and David M. Hercules.
Imprint New York : Plenum Press, 1991.


 Main Stacks  QC 176 .8 .S8I66 1991    AVAILABLE
Description xvii, 469 p. : ill. ; 24 cm.
Series Methods of surface characterization ; v. 2.
Bibliog. Includes bibliographical references and index.
Subject Solids -- Surfaces -- Analysis.
Secondary ion mass spectrometry.
Surface chemistry.
Contents Overview of ion spectroscopies for surface compositional analysis / A.W. Czanderna -- Surface structure and reaction studies by ion-solid collisions / Nicholas Winograd and Barbara J. Garrison -- Particle-induced desorption ionization techniques for organic mass spectrometry / Kenneth L. Busch -- Laser resonant and nonresonant photoionization of sputtered neutrals / Christopher H. Becker -- Rutherford backscattering and nuclear reaction analysis / L.C. Feldman -- Ion scattering spectroscopy / E. Taglauer -- Comparisons of SIMS, SNMS, ISS, RBS, AES, and XPS methods for surface compositional analysis / C.J. Powell, D.M. Hercules, and A.W. Czanderna.
Other Author Czanderna, Alvin Warren, 1930-
Hercules, David M.