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MANUSCRIPT
Author Pena, Diana.
Title Global processing and test induced stresses of Hall elements / by Diana Pena.
Imprint 1994.

Copies/Volumes

LOCATION CALL # STATUS
 M&M Microfilm  MF 317 Roll 325    LIB USE ONLY
 Main Stacks  TK7871.85 .P46 1994    AVAILABLE
 Main Stacks  TK7871.85 .P46 1994    AVAILABLE
Description xii, 130 leaves : ill. ; 28 cm.
Series Master's thesis / University of Texas at El Paso ; no. 4502.
University of Texas at El Paso. Master's thesis ; no. 4502.
Note Thesis (M.S.)--University of Texas at El Paso, 1994.
Vita.
Bibliog. Bibliography: leaves 36-37.
Subject Semiconductor wafers.
Strains and stresses.
Finite element method.